Equipment information	Maker: ㈱リガク/Rigaku corporation Specs: This high-resolution automated X-ray diffraction system ( SmartLab ) can be used for nanoscale characterizations of various kinds of materials, including metals, semiconductors, ceramics, organic materials, and polymers. SmartLab allows us to perform advanced measurements critical to materials research from X-ray diffraction (XRD) to X-ray reflectivity (XRR) to small-angle X-ray scattering (SAXS). [Specifications] ●X-ray Target : Cu target ●Goniometer : Sample flat goniometer ●Goniometer movement range : 2θ: -3°~ 160°, 2θx: -3°~ 120°, x: -5°~95°, φ: -5°~95°, φ: -360°~360° ●Detector : Scintillatiometer, 2D semiconductor ●Incident optical devices : Multilayer mirror Location: 301(1). I2CNER buildingⅡ Other information:
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Support information	Customer service:
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Person in charge	george_harrington,masamichi_nishihara

[Contact]
以下のURLより、各部門の汎用機器担当者をご確認ください。
Please refer to the URL below to find the responsible person in your group and thrust.

http://i2cner.kyushu-u.ac.jp/equipment/uploads/20201221095247uploads_3_%E6%B1%8E%E7%94%A8%E8%A3%85%E7%BD%AE%E6%8B%85%E5%BD%93%E8%80%85%E4%B8%80%E8%A6%A7_Responsible%20person%20in%20a%20group%20and%20a%20thrust.pdf

[Note]
XRD新規ユーザーはX線登録が必要です。（要：ガラスバッジ）
手続きに関しては、支援部門"iq-kenkyu@jimu.kyushu-u.ac.jp"(担当：野上・柏木）にお問い合わせ下さい。
Any NEW user of XRD, needs to be registered as RI user. （Dosimeter is required.)
For the detail, please contact to Administrative Office (Nogami,Kashiwagi) "iq-kenkyu@jimu.kyushu-u.ac.jp".