走査型プローブ顕微鏡/SPM-9700 [ Ⅱ-301(1) ]
機器の詳細情報
| 機器情報 |
メーカー名: ㈱島津製作所/SHIMADZU 性能: Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700 offers higher performance, faster speeds, and easier operation. [Specifications] Observation Modes : Contact, Dynamic, Phase, Lateral Force (LFM), Force Modulation, Surface Potential (KFM) Resolution : X, Y: 0.2 nm, Z: 0.01 nm SPM Head : Displacement detection system : Light source/optical lever/detector Light source : Laser diode (ON/OFF) Irradiates cantilever continuously, even while replacing samples. Detector : Photodetector Accessories : Environment Controlled Chamber CH-III Temperature and Humidity Controller Sample Heating and Cooling Unit 設置場所: 301(1). I2CNER buildingⅡ その他: |
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| 関連資料をダウンロードするためにはログインする必要があります。 | |
| サポート情報 | 営業担当者等: |
| 関連資料をダウンロードするためにはログインする必要があります。 | |
| 機器の管理者 |
機器の掲示板(今月のお知らせ)
機器の掲示板（固定）
[Contact]
Dr. Harish Sivasankaran Ext. 90-6730 (Ito Campus)
harish@i2cner.kyushu-u.ac.jp
Dr. Harish Sivasankaran Ext. 90-6730 (Ito Campus)
harish@i2cner.kyushu-u.ac.jp
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| 時間: | 2017/09/03 |
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| 時間: | 2017/09/03 |
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※現在の時間帯以降で予約可能です。過去の時間帯は"-"と表示されます。
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