Secondary Ion Mass Spectrometry/PS02B11 [ Other rooms ]
Detail information
| Equipment information |
Maker: ION-TOF社/ION-TOF Specs: Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications. It provides detailed elemental and molecular information about the surface, thin layers, interfaces of the sample, and gives a full three-dimensional analysis. The use is widespread, including semiconductors, polymers, paint, coatings, glass, paper, metals, ceramics, biomaterials, pharmaceuticals and organic tissue. [Specifications] ●Vacuum system: Base pressure reached after bakeout < 6.7 x 10-8 mbar ●EDR Analyser: Mass resolusion >10,000 (29amu) M/△M FWHM ●Bi Cluster Ion Gun ●measurement range: μm2 - cm2 Location: 101, I2CNER BuildingⅠ Other information: |
|---|---|
| Please login to download related documents. | |
| Support information | Customer service: |
| Please login to download related documents. | |
| Person in charge | atsushi_takagaki |
BBS(This month's news)
BBS fixed
[Contact]
Prof. A. Takagaki Ext. 90-6711 (Ito Campus)
atakagak@cstf.kyushu-u.ac.jp
Prof. A. Takagaki Ext. 90-6711 (Ito Campus)
atakagak@cstf.kyushu-u.ac.jp
| Sun | Mon | Tue | Wed | Thu | Fri | Sat |
|---|---|---|---|---|---|---|
Advanced Energy Conversion Systems |
Advanced Energy Materials |
Multiscale Science and Engineering for Energy and the Environment |
Platform for International Collaborations and Partnerships |
Platform for Societal Implementation and Industrial Collaboration |
Molecular Photoconversion Devices |
Hydrogen Materials Compatibility |
Electrochemical Energy Conversion |
Thermal Science and Engineering |
Catalytic Materials Transformations |
CO2 Capture and Utilization |
CO2 Storage |
Energy Analysis |
Administrative office |