carrier mobility measuring system/CMM-250TP [ 403 ]
Detail information
| Equipment information |
Maker: 分光計器㈱/Bunkoukeiki Co.,Ltd. Specs: Use for electron and hole mobility/life time measurement of organic semiconductors, DSSCs, organic thin-film voltaics, etc. [Specifications] ●Range of measurable mobility ：10-6～ 10-3 cm2/V・s ●Range of film thickness : 0.1～μm ●Resolution capability of measurement time : ～10ns ●Light source : YAG laser Location: 404, I2CNER BuildingⅠ Other information: |
|---|---|
| Please login to download related documents. | |
| Support information | Customer service: |
| Please login to download related documents. | |
| Person in charge | motonori_watanabe |
BBS(This month's news)
BBS fixed
[Contact]
Assoc. Prof. Motonori Watanabe Ext. 90-6748 (Ito Campus)
mwata@i2cner.kyushu-u.ac.jp
Assoc. Prof. Motonori Watanabe Ext. 90-6748 (Ito Campus)
mwata@i2cner.kyushu-u.ac.jp